CrestOptics DeepSIM Super-Resolution System

Citations:
Supplier page
Description:

The Nikon CrestOptics DeepSIM Super-Resolution System is easy-to-use and enables scientists to access deep data from their biological samples without requiring any special sample preparation or dyes. This system operates across the entire excitation wavelength spectrum from 400 to 750 nm in order to provide maximum flexibility in fluorophore choice and optimal multichannel imaging without spectral overlap. Key features include 100 nm XY resolution, super-resolved data over 50 µm depth in non-clarified samples, and multi-spot lattice SIM for fast live imaging.

Specifications
Instrument Type

Super-Resolution

Supplier

Nikon

Product Page

Supplier page

FOV

25 mm diagonal (Confocal), 66 x 66 µm at 100X (SIM), 333 x 333 µm at 20X (SIM)

Absorbance / Excitation

400 - 750 nm / 400 - 850 nm

Applications

Live Cell Imaging, Super Resolution Imaging

Light Source

Laser

Instrument Configuration